TEVET’s strategic partner, National Instruments (NI), provides a compact, flexible, and powerful design within the PXIe-5172 oscilloscope. It includes the latest technology – low-power, high-resolution ADCs using a JESD204B high-speed serial interface for data transfer and high-performance, low-power Xilinx Kintex-7 FPGAs. These user programmable FPGAs allow you to customize the firmware such as adding in-line signal processing or advanced triggering. The resulting low latency means you can take tens or hundreds of live measurements and average them together in the same amount of time a traditional test system requires to take a single measurement. Key features include high flexibility with 100 MHz, 250 MS/s and 8 channels, input voltage range up to 80 V peak-to-peak with +/- 20V DC offset, and support for external sample and reference clocks.

Call a TEVET expert today to decrease your cost of test, shorten your time to market, and improve your test yield with the new PXIe-5172 reconfigurable oscilloscope.

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