Today, you need a smarter alternative to traditional ATE to meet cost and functionality requirements of the increasingly complex RF and mixed-signal ICs testing environment. As the challenges increased, the market for semiconductor ATE suppliers has shrunk. That’s where NI’s 40-year technical experience and TEVET’s 15-year procurement experience comes into play.

 

ATE Solutions in Real-World Applications

Our solutions are customer-defined, not vendor-defined, with smarter test solutions driven by future technologies – 5G, IoT, and smart vehicle. See how NI implements Semiconductor Test System (STS) approach to ATE for reduced test times, increased scalability, and cost-effectiveness in the case studies below.  Make a change and go with a smarter approach to ATE testing.

ON Semiconductor Reduces Test Times with the Semiconductor Test System (STS)

Use the Strength of the PXI Platform for a Smarter Approach to IC Test

IDT Lowers the Cost of Test with the Semiconductor Test System (STS)

 

Interested in adding the NI Semiconductor Test System platform to your testing environment? Have technical questions? Or want to utilize TEVET’s unique procurement capabilities (including, but definitely not limited to, our SDVOSB and HUBZone designations)? Then, access the links below:

NI Semiconductor Test System

Ask NI

Contact TEVET

 

 

 

Save Now on Your Trip to NIWeek 2019

Join us (TEVET and the rest of the industry) at NIWeek 2019 in Austin for May 20th-23rd. If you register now, you can save up to 25%. You have until March 22nd for the discount. Hurry up and make up your mind! We can’t wait to see you. And you can’t wait to see us….or NASA Astronaut, Captain Scott Kelly. We know the truth and won’t tell the Captain.

NI Week – Full Force Ahead

 

 

Featured On-Demand NI Webinar Series

NI engineering experts share their insights in each industry. Check out these featured on-demand webinar series along with the entire NI library. Never stop learning!

On-Demand NI Library